发明名称 METHOD AND APPARATUS FOR IMAGE ENCODING AND DECODING USING INTRA PREDICTION
摘要 Provided are a method and apparatus for intra predicting an image, which generate a prediction value via linear interpolation in horizontal and vertical directions of a current prediction unit. The method includes: generating first and second virtual pixels by using at least one adjacent pixel located upper right and lower left to a current prediction unit; obtaining a first prediction value of a current pixel via linear interpolation using an adjacent left pixel located on the same line as the first virtual pixel and the current pixel; obtaining a second prediction value of the current pixel via linear interpolation using an adjacent upper pixel located on the same column as the second virtual pixel and the current pixel; and obtaining a prediction value of the current pixel by using the first and second prediction values.
申请公布号 US2015264379(A1) 申请公布日期 2015.09.17
申请号 US201514723992 申请日期 2015.05.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE Tammy;CHEN Jianle
分类号 H04N19/51;H04N19/13;H04N19/61;H04N19/91 主分类号 H04N19/51
代理机构 代理人
主权项 1. A method of intra predicting an image, the method comprising: acquiring reference samples including a first corner adjacent sample, a second corner adjacent sample, a first side adjacent sample, and a second adjacent sample, the reference samples used for prediction of a current sample; and determining a prediction value of the current sample based on the reference samples, wherein, the first corner adjacent sample is located at an intersection of a row adjacent to an upper side of the current block and a column adjacent to a right side of the current block, the second corner adjacent sample is located at an intersection of a row adjacent to a lower side of the current block and a column adjacent to a left side of the current block the first side adjacent sample is located at an intersection of a row in which the current sample is located and a column adjacent to the left side of the current block, and the second side adjacent sample is located at an intersection of the row adjacent to the upper side of the current block and a column in which the current sample is located.
地址 Suwon-si KR