发明名称 MEMORY REPAIRING APPARATUS AND METHOD, AND SYSTEM FOR TESTING AND REPAIRING MEMORY EMPLOYING THE SAME
摘要 The present invention relates to memory repairing device and method, and a system for inspecting and repairing a memory by using the device and method. According to an embodiment of the present invention, the memory repairing apparatus includes a memory classifying unit, a repairing method determining unit, and a memory matching unit. The memory classifying unit classifies multiple memories into a good memory which can be repaired by using a spare cell array equipped in a corresponding memory or having no defect, an inter-repairable memory which can be repaired by using a spare cell array arranged in another memory, and a defective memory which cannot be repaired. The repairing method determining unit determines a repairing method which can be applied to one of the memories, which has a defect. The memory matching unit matches one good memory and one inter-repairable memory based on a first repairing method, and matches another good memory and another inter-repairable memory remained after the previous matching operation based on a second repairing method different from the first repairing method.
申请公布号 KR20150105055(A) 申请公布日期 2015.09.16
申请号 KR20140027238 申请日期 2014.03.07
申请人 INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY 发明人 KANG, SUNG HO;KANG, WOO HEON
分类号 G11C29/00 主分类号 G11C29/00
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