| 摘要 |
The present invention relates to a test socket for testing the electrical properties of a complicated electronic device. The test socket according to the present invention includes a plurality of probes which are expanded and contracted in a test direction, a probe supporter which supports the probes to touch one end of the probe with a test contact point of a subject, a PCB which is arranged on the lower side of the probe supporter, has an opening part through the other ends of the probes pass, and includes at least one first pad which is in contact with the other end of at least one probe and at least one second pad which is opposite to the first pad, and an electrical path which is extended from the first pad and the second pad and is connected to the mounted electronic component, and a bottom supporter which is arranged on the lower side of the PCB and supports the other end of the probe passing through the opening part and a plurality of conductive parts which are in contact with the second pad. |
