| 摘要 |
The purpose of the present invention is to provide an art of suppressing discharge at the time of performing evaluation. A semiconductor device (1) is provided with: a semiconductor base body (11) having an element region (11a) and a terminal region (11b); a plurality of electrode pads (12) that are disposed on a region separated from the terminal region (11b), said region being a part of the element region (11a) of the semiconductor base body (11); an insulating protection film (13) having openings (13a) that are provided above the electrode pads (12), respectively; and a plurality of conductive layers (14), which are disposed on the protection film (13), and which are electrically connected to the electrode pads (12), respectively, through the openings (13a). Each of the conductive layers (14) extends to the terminal region (11b) or close to the terminal region in a planar view. |
