发明名称 |
DEEP TRENCH ISOLATION STRUCTURE LAYOUT AND METHOD THEREOF |
摘要 |
The embodiments described herein provide a semiconductor device layout and method that can be utilized in a wide variety of semiconductor devices. In one embodiment a semiconductor device is provided that includes a plurality of deep trench isolation structures that define and surround a first plurality of first trench-isolated regions in the substrate, and further define a second plurality of second trench-isolated regions in the substrate. The first plurality of first trench-isolated regions is arranged in a plurality of first columns, with each of the first columns including at least two of the first plurality of first trench-isolated regions. Likewise, the plurality of first columns are interleaved with the second trench-isolated regions to alternate in an array such that a second trench-isolated region is between consecutive first columns in the array and such that at least two first trench-isolated regions are between consecutive second trench-isolated regions in the array. |
申请公布号 |
US2015255537(A1) |
申请公布日期 |
2015.09.10 |
申请号 |
US201414196278 |
申请日期 |
2014.03.04 |
申请人 |
Freescale Semiconductor, Inc. |
发明人 |
PIGOTT John M.;ROGERS Brent D.;GRAY Randall C. |
分类号 |
H01L29/06;H01L27/06;H01L21/762;H01L23/525 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a semiconductor substrate; and a plurality of deep trench isolation structures formed in the semiconductor substrate, the plurality of deep trench isolation structures defining and surrounding a first plurality of first trench-isolated regions in the substrate and a second plurality of second trench-isolated regions in the substrate, wherein
each of the first plurality of first trench-isolated regions have a first dimension along a first direction and each of the second plurality of second trench-isolated regions have a corresponding second dimension along the first direction, and where the second dimension is at least twice the first dimension,the first plurality of first trench-isolated regions are arranged in a plurality of first columns, with each of the first columns including at least two of the first plurality of first trench-isolated regions arranged along the first direction, andthe plurality of first columns are interleaved with the second trench-isolated regions to alternate in an array such that at least one second trench-isolated region is between consecutive first columns in the array. |
地址 |
Austin TX US |