发明名称 SEMICONDUCTOR ARRANGEMENT AND FORMATION THEREOF
摘要 A semiconductor arrangement and method of formation are provided. The semiconductor arrangement includes an electro-wetting-on-dielectric (EWOD) device. The EWOD device includes a top portion over a bottom portion and a channel gap between the top portion and the bottom portion. The bottom portion includes a driving dielectric layer over a first electrode, a second electrode and a first separating portion of an ILD layer between the first electrode and a second electrode. The driving dielectric layer has a first thickness less than about 1,000 Å. An EWOD device with a driving dielectric layer having a first thickness less 1000 Å requires a lower applied voltage to alter a shape of a droplet within the device and has a longer operating life than an EWOD device that requires a higher applied voltage to alter the shape of the droplet.
申请公布号 US2015253283(A1) 申请公布日期 2015.09.10
申请号 US201414200148 申请日期 2014.03.07
申请人 Taiwan Semiconductor Manufacturing Company Limited 发明人 Chang Yi-Hsien;Cheng Chun-Ren
分类号 G01N27/447;H01L21/768 主分类号 G01N27/447
代理机构 代理人
主权项 1. A semiconductor arrangement comprising: a first electrode adjacent a second electrode in a dielectric layer, the first electrode separated from the second electrode by a first separating portion of the dielectric layer, the dielectric layer formed over a first substrate; and a driving dielectric layer over and in contact with the first electrode, the second electrode and the first separating portion.
地址 Hsin-Chu TW
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