发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 An insulating film (2) is formed on a main surface of a semiconductor substrate (1) that includes an active region and a termination region. The insulating film (2) in the active region is etched to form an opening (3). The insulating film (2) is used as a mask and an impurity is implanted into the semiconductor substrate (1) in a direction tilted by 20° or more from a direction normal to the main surface of the semiconductor substrate (1) while rotating the semiconductor substrate (1) to form a diffusion layer (7) in the active region. The diffusion layer (7) extends wider than the opening (3) up to below the insulating film (2) on the termination region side.
申请公布号 US2015255290(A1) 申请公布日期 2015.09.10
申请号 US201214433191 申请日期 2012.12.07
申请人 Masuoka Fumihito;Nakamura Katsumi;Kachi Takao 发明人 Masuoka Fumihito;Nakamura Katsumi;Kachi Takao
分类号 H01L21/265;H01L29/10;H01L29/06 主分类号 H01L21/265
代理机构 代理人
主权项
地址 Tokyo JP