发明名称 |
DISTRIBUTED POWER SUPPLY ARCHITECTURE IN AUTOMATIC TEST EQUIPMENT |
摘要 |
An apparatus for providing a distributed and scalable number of power supplies used in automatic test equipment. The apparatus includes at least one Pin Electronics (PE) module comprising a plurality of PE channels. The apparatus includes at least one programmable power supply (PPS) module comprising a plurality of programmable power supply channels, wherein the at least one PPS module is remote from the at least one PE module. That apparatus includes a test site controller executing a test program comprising a plurality of test instructions delivered over the plurality of Pin Electronics (PE) channels and the plurality of programmable power supply (PPS) channels in order to test a plurality of devices under test (DUTs) in parallel. |
申请公布号 |
US2015253378(A1) |
申请公布日期 |
2015.09.10 |
申请号 |
US201414196873 |
申请日期 |
2014.03.04 |
申请人 |
Advantest Corporation |
发明人 |
DeLaPuente Edmundo |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
1. A system providing automatic testing of devices, comprising:
at least one Pin Electronics (PE) module comprising a plurality of PE channels; at least one programmable power supply (PPS) module comprising a plurality of programmable power supply channels, wherein said at least one PPS module is remote from said at least one PE module; and a test site controller executing a test program comprising a plurality of test instructions delivered over said plurality of Pin Electronics (PE) channels and said plurality of programmable power supply (PPS) channels in order to test a plurality of devices under test (DUTs) in parallel. |
地址 |
Tokyo JP |