发明名称 DISTRIBUTED POWER SUPPLY ARCHITECTURE IN AUTOMATIC TEST EQUIPMENT
摘要 An apparatus for providing a distributed and scalable number of power supplies used in automatic test equipment. The apparatus includes at least one Pin Electronics (PE) module comprising a plurality of PE channels. The apparatus includes at least one programmable power supply (PPS) module comprising a plurality of programmable power supply channels, wherein the at least one PPS module is remote from the at least one PE module. That apparatus includes a test site controller executing a test program comprising a plurality of test instructions delivered over the plurality of Pin Electronics (PE) channels and the plurality of programmable power supply (PPS) channels in order to test a plurality of devices under test (DUTs) in parallel.
申请公布号 US2015253378(A1) 申请公布日期 2015.09.10
申请号 US201414196873 申请日期 2014.03.04
申请人 Advantest Corporation 发明人 DeLaPuente Edmundo
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项 1. A system providing automatic testing of devices, comprising: at least one Pin Electronics (PE) module comprising a plurality of PE channels; at least one programmable power supply (PPS) module comprising a plurality of programmable power supply channels, wherein said at least one PPS module is remote from said at least one PE module; and a test site controller executing a test program comprising a plurality of test instructions delivered over said plurality of Pin Electronics (PE) channels and said plurality of programmable power supply (PPS) channels in order to test a plurality of devices under test (DUTs) in parallel.
地址 Tokyo JP