发明名称 |
MEASURING PARAMETERS OF PARTICULATE MATERIAL |
摘要 |
An apparatus for appraising gemstones, the apparatus comprising: a measurement cell comprising at least one sensor and a measurement location, the at least one sensor being arranged to measure one or more parameters of a gemstone when the gemstone is located at the measurement location; and a transportation means for transporting the gemstone to the measurement location; wherein the transportation means is configured to cause or allow the gemstone to be stationary at the measurement location whilst the at least one sensor measures one or more parameters of the gemstone. |
申请公布号 |
EP2914387(A1) |
申请公布日期 |
2015.09.09 |
申请号 |
EP20130783592 |
申请日期 |
2013.10.29 |
申请人 |
DE BEERS UK LIMITED |
发明人 |
SMITH, JAMES GORDON CHARTERS;READ, PHILIP;PORTSMOUTH, ANDREW JOHN |
分类号 |
B07C5/36;B07C5/342 |
主分类号 |
B07C5/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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