发明名称 MEASURING PARAMETERS OF PARTICULATE MATERIAL
摘要 An apparatus for appraising gemstones, the apparatus comprising: a measurement cell comprising at least one sensor and a measurement location, the at least one sensor being arranged to measure one or more parameters of a gemstone when the gemstone is located at the measurement location; and a transportation means for transporting the gemstone to the measurement location; wherein the transportation means is configured to cause or allow the gemstone to be stationary at the measurement location whilst the at least one sensor measures one or more parameters of the gemstone.
申请公布号 EP2914387(A1) 申请公布日期 2015.09.09
申请号 EP20130783592 申请日期 2013.10.29
申请人 DE BEERS UK LIMITED 发明人 SMITH, JAMES GORDON CHARTERS;READ, PHILIP;PORTSMOUTH, ANDREW JOHN
分类号 B07C5/36;B07C5/342 主分类号 B07C5/36
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