发明名称 接着構造パッド導通検査のためのシステムおよび方法
摘要 <p>A continuity test circuit for a boundary pad includes a pull-up transistor electrically connected between the boundary pad and a first power supply, and a pull-down transistor electrically connected between the boundary pad and a first reference ground potential. A normal output conductor is electrically connected to have a same electrical state as the boundary pad during normal operation. A continuity test output conductor is electrically connected to have a same electrical state as the boundary pad during continuity test operation. Continuity testing control circuitry is defined to control the pull-up transistor, the pull-down transistor, and the normal output conductor during continuity test operation such that an electrical state present on the continuity test output conductor indicates a status of electrical continuity between the boundary pad and either a second power supply or a second reference ground potential to which the boundary pad should be electrically connected.</p>
申请公布号 JP5775941(B2) 申请公布日期 2015.09.09
申请号 JP20130556784 申请日期 2012.02.27
申请人 发明人
分类号 G01R31/28;H01L21/822;H01L27/04 主分类号 G01R31/28
代理机构 代理人
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