发明名称 Active ESD protection circuit
摘要 A high-voltage gate driver circuit configured to drive a high-side power switch and a low-side power switch includes an active dv/dt triggered ESD protection circuit coupled between a protected node and a power rail node. The active dv/dt triggered ESD protection circuit includes a dv/dt circuit controlling an ESD protection transistor connected between the protected node and the power rail node. The ESD protection transistor is turned on when an ESD event occurs at the protected node to conduct ESD current from the protected node to the power rail node. The dv/dt circuit is charged up after a time constant to disable the ESD protection transistor.
申请公布号 US9130562(B2) 申请公布日期 2015.09.08
申请号 US201313801723 申请日期 2013.03.13
申请人 Alpha and Omega Semiconductor Incorporated 发明人 Mallikarjunaswamy Shekar
分类号 H03K17/081;H02H9/04 主分类号 H03K17/081
代理机构 Van Pelt, Yi & James LLP 代理人 Van Pelt, Yi & James LLP
主权项 1. A high-voltage gate driver circuit configured to drive a high-side power switch and a low-side power switch connected in series between an input voltage node and a ground potential, the gate driver circuit including a high-side control circuit formed in a floating tub and being supplied by a boost voltage at a boost node relative to a floating supply voltage at a floating supply voltage node, the gate driver circuit comprising: an active dv/dt triggered ESD protection circuit coupled between a protected node and a power rail node, the active dv/dt triggered ESD protection circuit including a dv/dt circuit controlling an ESD protection transistor, the dv/dt circuit being connected between the protected node and the power rail node and the ESD protection transistor having a first current handling terminal connected to the protected node, a second current handling terminal connected to the power rail node and a control terminal controlled by the dv/dt circuit, the ESD protection transistor being turned on in response to an ESD event occurring at the protected node to conduct ESD current from the protected node to the power rail node, the dv/dt circuit being charged up after a time constant to disable the ESD protection transistor.
地址 Sunnyvale CA US