发明名称 SAMPLE HOLDING TOOL AND PLASMA ETCHING DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a sample holding tool with improved long-term reliability of contact between a pin and an electrode.SOLUTION: A sample holding tool 10 includes: a base substance 1 made of a ceramic and having a sample holding surface 11 on an outer surface; and a first electrode 2 provided in the base substance 1. The base substance 1 has a hole part 12 which opens on the outer surface and uses the first electrode 2 as at least a part of its bottom part. The base substance 1 further includes a second electrode 3 provided on the first electrode 2 in the hole part 12. The structure allows the electrodes to be thickened in a portion to which an external terminal connection pin 5 is pressed.
申请公布号 JP2015159232(A) 申请公布日期 2015.09.03
申请号 JP20140034030 申请日期 2014.02.25
申请人 KYOCERA CORP 发明人 LEE SANGKEE
分类号 H01L21/683 主分类号 H01L21/683
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