发明名称 |
X-RAY INSPECTION APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray inspection apparatus capable of accurately inspecting a portion of an object under inspection at a desired height from a conveyor surface.SOLUTION: An X-ray inspection apparatus 1 includes a timing delay unit 44 which delays detection timing of an X-ray line sensor 60 located on the downstream side relative to detection timing of an adjacent X-ray line sensor 50 on the upstream side by a delay time corresponding to a height specified through a setup manipulation unit 49. The delay period used by the timing delay unit 44 is pre-stored in a delay time storage unit 45 as a function of the height from a conveyor surface 2a at desired conveying speed. The X-ray inspection apparatus 1 also has a delay time setting unit 47 for setting the delay time to be pre-stored in the delay time storage unit 45, where the delay time setting unit 47 sets the delay time as a linear function regressed from a first detection timing difference &Dgr;t(1) and second detection timing difference &Dgr;t(2). |
申请公布号 |
JP2015158406(A) |
申请公布日期 |
2015.09.03 |
申请号 |
JP20140032801 |
申请日期 |
2014.02.24 |
申请人 |
ANRITSU SANKI SYSTEM CO LTD |
发明人 |
OTSUKI TOMOYASU;KANAI TAKASHI |
分类号 |
G01N23/04 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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