发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a duty adjustment circuit which causes less deterioration in signal quality.SOLUTION: A semiconductor device comprises: a duty offset circuit 151 for creating an internal clock signal PCLKA1 with adjusted duty upon receiving an internal clock signal PCLK0; a duty offset circuit 152 for creating an internal clock signal PCLKA2 with adjusted duty upon receiving the internal clock signal PCLKA1; and a selector circuit 159 for selecting either of the internal clock signal PCLKA1 or the internal clock signal PCLKA2. According to the present embodiment, since it is possible to bypass some duty offset circuits, the number of steps of logical circuits through which the internal clock signal passes can be decreased as appropriate. This can inhibit deterioration in signal quality of the internal clock signal by the duty adjustment circuit itself.</p>
申请公布号 JP2015159407(A) 申请公布日期 2015.09.03
申请号 JP20140032776 申请日期 2014.02.24
申请人 MICRON TECHNOLOGY INC 发明人 ISHIBASHI SHUICHI;MIYANO KAZUTAKA
分类号 H03K5/05;G06F1/08;H03L7/081 主分类号 H03K5/05
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