发明名称 METHOD OF FABRICATING NITRIDE FILM AND METHOD OF CONTROLLING COMPRESSIVE STRESS OF THE SAME
摘要 The present invention relates to a method of fabricating a nitride film, which may easily control compressive stress while stably maintaining the film quality using the atomic layer deposition, and the nitride film having compressive stress is formed on a substrate by performing a unit cycle at least one time, the unit cycle including: a first step of providing a source gas on the substrate to absorb at least of the source gas on the substrate; a second step of providing a first purge gas on the substrate; a third step of forming a unit deposition film on the substrate by providing the substrate with a stress controlling gas including a nitrogen gas (N2) and a reaction gas containing nitrogen components (N) other than the nitrogen gas (N2) in a plasma state; and a fourth step of providing a second purge gas on the substrate.
申请公布号 US2015249004(A1) 申请公布日期 2015.09.03
申请号 US201514630864 申请日期 2015.02.25
申请人 WONIK IPS CO., LTD. 发明人 LEE Kyungeun;LA Doohyun;CHANG Junseok;CHO Byungchul;RYU Dongho;PARK Juhwan;KIM Youngjun
分类号 H01L21/02;C23C16/44;C23C16/34;C23C16/455 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method of fabricating a nitride film, in which a nitride film having compressive stress is formed on a substrate by performing a unit cycle at least one time, the unit cycle comprising: a first step of providing a source gas on the substrate to adsorb at least a part of the source gas on the substrate; a second step of providing a first purge gas on the substrate; a third step of forming a unit deposition film on the substrate by providing the substrate with a stress controlling gas comprising a nitrogen gas (N2) and a reaction gas containing nitrogen components (N) other than the nitrogen gas (N2) in a plasma state; and a fourth step of providing a second purge gas on the substrate.
地址 Gyeonggi-do KR
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