发明名称 LOW-TEMPERATURE SELECTIVE EPITAXIAL GROWTH OF SILICON FOR DEVICE INTEGRATION
摘要 An epitaxy method includes providing an exposed crystalline region of a substrate material. Silicon is epitaxially deposited on the substrate material in a low temperature process wherein a deposition temperature is less than 500 degrees Celsius. A source gas is diluted with a dilution gas with a gas ratio of dilution gas to source gas of less than 1000.
申请公布号 US2015247259(A1) 申请公布日期 2015.09.03
申请号 US201514711403 申请日期 2015.05.13
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HEKMATSHOAR-TABARI BAHMAN;KHAKIFIROOZ ALI;REZNICEK ALEXANDER;SADANA DEVENDRA K.;SHAHIDI GHAVAM G.;SHAHRJERDI DAVOOD
分类号 C30B25/18;C30B29/06;C30B25/10 主分类号 C30B25/18
代理机构 代理人
主权项 1. An epitaxy method, comprising: providing a crystalline substrate material; growing an insulator on the substrate material; opening the insulator to form exposed areas of the substrate material; depositing silicon on the exposed areas of the substrate material to form epitaxial silicon on the exposed areas and form non-epitaxial silicon in other than the exposed areas in a low temperature process wherein a deposition temperature is less than 500 degrees Celsius; and etching the non-epitaxial silicon using a plasma to further epitaxial deposition of silicon over the exposed areas.
地址 ARMONK NY US