发明名称 |
LOW-TEMPERATURE SELECTIVE EPITAXIAL GROWTH OF SILICON FOR DEVICE INTEGRATION |
摘要 |
An epitaxy method includes providing an exposed crystalline region of a substrate material. Silicon is epitaxially deposited on the substrate material in a low temperature process wherein a deposition temperature is less than 500 degrees Celsius. A source gas is diluted with a dilution gas with a gas ratio of dilution gas to source gas of less than 1000. |
申请公布号 |
US2015247259(A1) |
申请公布日期 |
2015.09.03 |
申请号 |
US201514711403 |
申请日期 |
2015.05.13 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
HEKMATSHOAR-TABARI BAHMAN;KHAKIFIROOZ ALI;REZNICEK ALEXANDER;SADANA DEVENDRA K.;SHAHIDI GHAVAM G.;SHAHRJERDI DAVOOD |
分类号 |
C30B25/18;C30B29/06;C30B25/10 |
主分类号 |
C30B25/18 |
代理机构 |
|
代理人 |
|
主权项 |
1. An epitaxy method, comprising:
providing a crystalline substrate material; growing an insulator on the substrate material; opening the insulator to form exposed areas of the substrate material; depositing silicon on the exposed areas of the substrate material to form epitaxial silicon on the exposed areas and form non-epitaxial silicon in other than the exposed areas in a low temperature process wherein a deposition temperature is less than 500 degrees Celsius; and etching the non-epitaxial silicon using a plasma to further epitaxial deposition of silicon over the exposed areas. |
地址 |
ARMONK NY US |