| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection apparatus capable of improving accuracy of defect detection.SOLUTION: An inspection apparatus 100 for inspecting a backlight, where a light guide plate, a diffusion sheet, and a prism sheet are laminated, comprises: a charging part 1 for charging the light guide plate, the diffusion sheet, and the prism sheet; and an inspection part 2 for inspecting the backlight while the light guide plate, the diffusion sheet, and the prism sheet are charged. |
