发明名称 FATIGUE TESTING METHOD FOR CONDUCTIVE MATERIAL
摘要 PROBLEM TO BE SOLVED: To provide a fatigue testing method for a conductive material, in which can be used a fatigue test piece having the average crystal grain diameter adjusted, and having the crystal structure homogenized. ! SOLUTION: A fatigue testing method for a conductive material, includes: a first step of applying plastic deformation in a degree of processing of 1.5 or more to a workpiece 12 made from a conductive material to prepare an original test piece 11 consisting of a crystal structure having an average crystal grain diameter of 50 μm or less; and a second step of applying plastic deformation in a decreased degree of processing of 0.3 or less to the original test piece 11 to maintain the state of the crystal structure formed in the original test piece 11 while preparing a thin plate test piece 10 from the original test piece 11. The prepared thin plate test piece 10 is supported in a cantilever manner and resonated to repeatedly apply bending deformation to the thin plate test piece 10, an
申请公布号 JP2015158365(A) 申请公布日期 2015.09.03
申请号 JP20120132151 申请日期 2012.06.11
申请人 DAIDEN CO LTD ; KUMAMOTO UNIV 发明人 IN HIROYUKI ; ANNO FUMIYO ; MATSUNAGA DAISUKE ; KITAHARA HIROMOTO ; ANDO SHINJI ; TSUSHIDA MASAYUKI ; OGAWA TOSHIBUMI
分类号 G01N3/34 主分类号 G01N3/34
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