发明名称 HIGHLY TRANSPARENT ALUMINUM NITRIDE SINGLE CRYSTALLINE LAYERS AND DEVICES MADE THEREFROM
摘要 The invention provides highly transparent single crystalline AlN layers as device substrates for light emitting diodes in order to improve the output and operational degradation of light emitting devices. The highly transparent single crystalline AlN layers have a refractive index in the a-axis direction in the range of 2.250 to 2.400 and an absorption coefficient less than or equal to 15 cm-1 at a wavelength of 265 nm. The invention also provides a method for growing highly transparent single crystalline A1N layers, the method including the steps of maintaining the amount of Al contained in wall deposits formed in a flow channel of a reactor at a level lower than or equal to 30% of the total amount of aluminum fed into the reactor, and maintaining the wall temperature in the flow channel at less than or equal to 1200° C.
申请公布号 US2015247260(A1) 申请公布日期 2015.09.03
申请号 US201214422888 申请日期 2012.08.23
申请人 Koukitu Akinori;Kumagai Yoshinao;Nagashima Toru;Kinoshita Toru;Kubota Yuki;Dalmau Rafael F.;Xie Jinqiao;Moody Baxter F.;Schlesser RAOUL;Sitar Zlatko 发明人 Koukitu Akinori;Kumagai Yoshinao;Nagashima Toru;Kinoshita Toru;Kubota Yuki;Dalmau Rafael F.;Xie Jinqiao;Moody Baxter F.;Schlesser RAOUL;Sitar Zlatko
分类号 C30B25/20;C30B29/40;H01L33/00;H01L33/32;H01L33/18;C30B25/14;C01B21/072 主分类号 C30B25/20
代理机构 代理人
主权项 1. A highly transparent single crystalline AlN layer having a refractive index in the a-axis direction in the range of 2.250 to 2.400 and an absorption coefficient less than or equal to 15 cm−1 at a wavelength of 265 nm.
地址 Tokyo JP