发明名称 Detection device, electronic apparatus, and robot
摘要 A first substrate that includes pressure sensors which are disposed in plural around a reference point; an approximately hemispherical elastic protrusion that is positioned so that the center of the elastic protrusion is approximately disposed in a position which is overlapped with the reference point, and is elastically deformed by an external force; and a second substrate that is separated from the elastic protrusion and installed on a side which is opposite to the first substrate are provided. When the external force is applied, a predetermined calculation is performed by using a pressure value which is detected through each pressure sensor, and the direction and the intensity of the applied external force are obtained.
申请公布号 US9121782(B2) 申请公布日期 2015.09.01
申请号 US201414171297 申请日期 2014.02.03
申请人 SEIKO EPSON CORPORATION 发明人 Amano Takahiro;Ikebe Tomo
分类号 G01D7/00;G01L1/04;B25J13/08;G01L1/02;G01L1/20;G01L5/00;G06F3/041 主分类号 G01D7/00
代理机构 Oliff PLC 代理人 Oliff PLC
主权项 1. A detection device comprising: a first substrate that includes a plurality of pressure sensors that are disposed around a reference point; an elastic protrusion that is positioned so that the center of gravity of the elastic protrusion is disposed in a position which is overlapped with the reference point, and is elastically deformed by an external force; a second substrate that is separated from the elastic protrusion and installed on a side which is opposite to the first substrate; and a calculation device that calculates a difference between pressure values detected by the plurality of pressure sensors due to the elastic deformation of the elastic protrusion by the external force, wherein the elastic protrusion is formed on the first substrate so that a tip portion of the elastic protrusion makes contact with the second substrate, and a direction and an intensity of the external force, which is applied from a side of the second substrate, are detected in a state where the tip portion of the elastic protrusion makes contact with the second substrate, and the calculation device calculates the direction and the intensity of the applied external force based on the difference.
地址 Tokyo JP