发明名称 |
Method to form group III-V and Si/Ge FINFET on insulator |
摘要 |
A method includes providing a structure having a substrate, a first electrically insulating layer overlying the substrate, a first semiconductor layer comprised of a first semiconductor material overlying the first electrically insulating layer, a second electrically insulating layer overlying the first semiconductor layer in a first portion of the structure and a second semiconductor layer comprised of a second, different semiconductor material overlying the second electrically insulating layer in the first portion. The method further includes growing additional first semiconductor material on the first semiconductor layer in a second portion of the structure to form a regrown semiconductor layer; forming fins; forming gate structures orthogonal to the fins and removing at least a portion of the first semiconductor layer in the first portion of the structure to form a void and filling the void with insulating material. Structures formed by the method are also disclosed. |
申请公布号 |
US9123585(B1) |
申请公布日期 |
2015.09.01 |
申请号 |
US201414177447 |
申请日期 |
2014.02.11 |
申请人 |
International Business Machines Corporation |
发明人 |
Czornomaz Lukas;Fompeyrine Jean;Leobandung Effendi |
分类号 |
H01L21/84;H01L27/12;H01L27/092;H01L29/161;H01L29/20;H01L21/02;H01L29/78;H01L21/8238 |
主分类号 |
H01L21/84 |
代理机构 |
Harrington & Smith |
代理人 |
Harrington & Smith ;Percello Louis J. |
主权项 |
1. A method, comprising:
providing a structure comprised of a substrate, a first electrically insulating layer overlying a surface of the substrate, a first semiconductor layer comprised of a first semiconductor material overlying the first electrically insulating layer, a second electrically insulating layer overlying the first semiconductor layer in a first portion of the structure, and a second semiconductor layer comprised of a second semiconductor material different from the first semiconductor material overlying the second electrically insulating layer in the first portion; growing additional first semiconductor material on the first semiconductor layer in a second portion of the structure to form a regrown semiconductor layer; forming fins in the regrown semiconductor layer and in the second semiconductor layer; forming gate structures orthogonal to the fins; removing at least a portion of the first semiconductor layer in the first portion of the structure between the first electrically insulating layer and the second electrically insulating layer to form a void, where the step of removing is performed subsequent to the step of forming the gate structures; and filling the void with an electrically insulating material. |
地址 |
Armonk NY US |