Optical method and system for critical dimensions and thickness characterization,申请号IL20150239632-传众专利搜索

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法人/股东/高管

发明名称	Optical method and system for critical dimensions and thickness characterization
摘要
申请公布号	IL239632(D0)	申请公布日期	2015.08.31
申请号	IL20150239632	申请日期	2015.06.25
申请人	NOVA MEASURING INSTRUMENTS LTD.	发明人
分类号	G01B	主分类号	G01B
代理机构		代理人
主权项
地址

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