发明名称 |
TUNNELING TRANSISTOR HAVING A VERTICAL CHANNEL, VARIABLE RESISTIVE MEMORY DEVICE INCLUDING THE SAME, AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
A tunneling transistor including a semiconductor substrate on which a source is formed in an upper region and having a first semiconductor material layer, a pillar formed on the semiconductor substrate and having a structure in which a channel layer and a drain are sequentially stacked, a gate formed to surround a circumference of the pillar, and a second semiconductor material layer constituting a portion of the source, formed between the source and the channel layer, having the same conductivity type as the source, and having a band gap smaller than the first semiconductor material layer. Wherein, the source and the drain have opposite conductivity types. |
申请公布号 |
US2015243707(A1) |
申请公布日期 |
2015.08.27 |
申请号 |
US201414297291 |
申请日期 |
2014.06.05 |
申请人 |
SK hynix Inc. |
发明人 |
PARK Nam Kyun |
分类号 |
H01L27/24;H01L29/66;H01L29/78 |
主分类号 |
H01L27/24 |
代理机构 |
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代理人 |
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主权项 |
1. A tunneling transistor comprising:
a semiconductor substrate having a source formed in an upper region and including a first semiconductor material layer; a pillar formed on the semiconductor substrate and having a channel layer and a drain sequentially stacked; a gate formed to surround the pillar; and a second semiconductor material layer formed between the in source and the channel layer, the second semiconductor material layer having the same conductivity type as the source and having a band gap lower than the first semiconductor material layer, wherein the source and the drain have opposite conductivity types from each other. |
地址 |
Gyeonggi-do KR |