发明名称 Variable resistance memory devices and method of forming the same
摘要 A variable resistance memory device includes a lower electrode on a substrate, a variable resistance pattern on the lower electrode, and an upper electrode on the variable resistance pattern. The upper electrode is in contact with at least a sidewall of the variable resistance pattern.
申请公布号 US9118003(B2) 申请公布日期 2015.08.25
申请号 US201313792952 申请日期 2013.03.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Park JeongHee;Kang Mansug
分类号 H01L47/00;H01L45/00;H01L27/24 主分类号 H01L47/00
代理机构 Lee & Morse, P.C. 代理人 Lee & Morse, P.C.
主权项 1. A variable resistance memory device, comprising: a lower electrode on a substrate; a variable resistance pattern on the lower electrode; a mold layer in contact with a portion of a sidewall of the variable resistance pattern; and an upper electrode on the variable resistance pattern, the upper electrode being in contact with at least another portion of the sidewall of the variable resistance pattern.
地址 Suwon-si, Gyeonggi-do KR