发明名称 |
Variable resistance memory devices and method of forming the same |
摘要 |
A variable resistance memory device includes a lower electrode on a substrate, a variable resistance pattern on the lower electrode, and an upper electrode on the variable resistance pattern. The upper electrode is in contact with at least a sidewall of the variable resistance pattern. |
申请公布号 |
US9118003(B2) |
申请公布日期 |
2015.08.25 |
申请号 |
US201313792952 |
申请日期 |
2013.03.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Park JeongHee;Kang Mansug |
分类号 |
H01L47/00;H01L45/00;H01L27/24 |
主分类号 |
H01L47/00 |
代理机构 |
Lee & Morse, P.C. |
代理人 |
Lee & Morse, P.C. |
主权项 |
1. A variable resistance memory device, comprising:
a lower electrode on a substrate; a variable resistance pattern on the lower electrode; a mold layer in contact with a portion of a sidewall of the variable resistance pattern; and an upper electrode on the variable resistance pattern, the upper electrode being in contact with at least another portion of the sidewall of the variable resistance pattern. |
地址 |
Suwon-si, Gyeonggi-do KR |