发明名称 Composition for manufacturing oxide semiconductor and method for manufacturing thin-film transistor substrate using the same
摘要 According to a method of manufacturing a thin film transistor substrate, a composition including a metal oxalate and a solvent for manufacturing an oxide semiconductor is coated to form a thin film, the thin film is annealed, and the thin film is patterned to form a semiconductor pattern.
申请公布号 US9115287(B2) 申请公布日期 2015.08.25
申请号 US201213670120 申请日期 2012.11.06
申请人 Samsung Display Co., Ltd. 发明人 Jeong Yeon-Taek;Kim Bo-Sung;Lee Doo-Hyoung;Kim Doo-Na;Park Eun-Hye;Kim Dong-Lim;Kim Hyun-Jae;Rim You-Seung;Lim Hyun-Soo
分类号 H01L21/00;C09D5/00;H01L29/66;C04B35/453;H01L29/24;H01L29/786;H01L27/12;H01L29/22;C04B35/01;C04B35/457;C04B35/622 主分类号 H01L21/00
代理机构 Innovation Counsel LLP 代理人 Innovation Counsel LLP
主权项 1. A method of manufacturing a thin film transistor substrate comprising a gate electrode, a semiconductor pattern, a source electrode and a drain electrode, the method comprising: coating a composition comprising a metal oxalate and a solvent on a substrate to form a thin film on the substrate; annealing the thin film; and patterning the thin film to form a semiconductor pattern, wherein the metal oxalate is represented by following Chemical Formula 1, wherein M represents at least one of zinc, tin, indium and gallium; X represents at least one of hydroxyl group, alkoxy group, halogen, nitrate, acetate ion, sulfate ion, phosphate ion, oxalate ion, perchlorate ion, chlorate ion, chlorine dioxide and tetrafluoroborate; HX is a molecule formed by hydrogen combined with at least one of hydroxyl group, alkoxy group, halogen, nitrate, acetate ion, sulfate ion, phosphate ion, oxalate ion, perchlorate ion, chlorate ion, chlorine dioxide and tetrafluoroborate; “a” represents a value obtained from subtracting 2 from M's atomic value of M; and “b” is an integral number from 1 to 4.
地址 KR