Capacitive touch panel, manufacturing method and scanning method

摘要

The present invention discloses a capacitive touch panel, comprises a touch sensing pattern form on a substrate, which could generate a sensing signals in response to a touch on the capacitive touch panel; a plurality of first signal lines and a second signal line for conducting the sensing signals; the touch sensing pattern comprises a plurality of first conductive assemblies arranged in a first direction, a first end of each first conductive assembly respectively connects to a corresponding first signal line; the second signal line connects the second ends of all of the first conductive assemblies together.

主权项

1. A scanning method comprising:
providing a plurality of first conductive assemblies arranged in a first direction; sequentially scanning each of the first conductive assemblies through a corresponding first signal line connected to a first end of each first conductive assembly, meanwhile providing a constant signal source with a common driving signal through a second signal line to a plurality of second ends of all the first conductive assemblies, wherein the step of sequentially scanning each of the first conductive assemblies further comprises: sequentially providing a scanning signal to each of the first conductive assemblies through the corresponding first signal line, and wherein the scanning signal has a same frequency, a same potential and a same phase with the common driving signal; wherein when scanning one of the first conductive assemblies, the scanning signal is input to the first end of the scanned first conductive assembly to charge and then discharge repeatedly for detecting the capacitance variation thereof, and the second end of the scanned first conductive assembly is connected to the constant signal source through the second signal line while the first ends and the second ends of other non-scanned first conductive assemblies are connected to the constant signal source; and generating touch sensing signals while the capacitance variation of the scanned first conductive assembly is detected.