| 摘要 |
The invention relates to an apparatus for testing electronic device (10), said apparatus comprising a test head (20) coupled to at least one immovably mounted test socket (8), a positioning device (4) for positioning the electronic device (10) in testing position and a lead-backer (5) attached to the positioning device (4) for supporting the electronic device (10) and pressing it against the test socket (8). According to the invention a supply port (11, 13, 14, 15) for supplying a temperature control system (16, 17) of the said lead-backer (5) is immovably mounted beside the said test socket (8), the said temperature control system (16, 17) of the said lead-backer (5) and the said supply port (11, 13, 14, 15) comunicate with each other when the electronic device (10) is in testing position, whereby the said supply port (11, 13, 14, 15) to the said temperature control system (16, 17) of the said lead-backer (5). |
