| 摘要 |
<p>PROBLEM TO BE SOLVED: To predict the time when abnormality occurs in a circuit in an LSI with a simple configuration.SOLUTION: An input data generation part (100) is disposed in an LSI in which an inspection object circuit as a circuit to be inspected is disposed. An FF1(101) and an FF2(102) are flip flops of the same type as a flip flop included in the inspection object circuit. The input data generation part (100) repeatedly outputs a signal to the FF1(101). A delay control part (104) delays the signal from the FF1(101) by an inspection delay amount as a delay amount beyond an allowable delay amount allowed by the inspection object circuit, and outputs a delayed signal to the FF2(102). A result determination part (105) and a result tabulation/notification part (106) predicts a timing in which delay abnormality occurs in the inspection object circuit in accordance with the secular change of the delay amount which occurs in the inspection object circuit on the basis of the signal output from the FF2(102).</p> |
