发明名称 |
METHOD OF MANUFACTURING NON-VOLATILE MEMORY DEVICE |
摘要 |
A method for manufacturing a non-volatile memory includes depositing a first conductive film and a protective film on a substrate including a logic area and a cell area, patterning the protective film, depositing a hard mask layer on the first conductive film and the patterned protective film to pattern the hard mask layer, using the patterned hard mask layer to form a logic gate on the logic area, exposing a surface of the first conductive film in the cell area and forming a control gate on the cell area. |
申请公布号 |
US2015235868(A1) |
申请公布日期 |
2015.08.20 |
申请号 |
US201414523183 |
申请日期 |
2014.10.24 |
申请人 |
Magnachip Semiconductor, Ltd. |
发明人 |
CHANG Yunseong;KANG Yangbeom |
分类号 |
H01L21/3213;H01L27/115;H01L21/311;H01L21/28;H01L21/02 |
主分类号 |
H01L21/3213 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of manufacturing a non-volatile memory device, comprising:
providing a substrate comprising a logic area and a cell area; forming a floating gate on the cell area; depositing a first conductive film and a protective film on the substrate; patterning the protective film; depositing a hard mask layer on the first conductive film and the patterned protective film; patterning the hard mask layer; forming a logic gate on the logic area using the patterned hard mask layer; exposing a surface of the first conductive film in the cell area; and forming a control gate on the cell area. |
地址 |
Cheongju-si KR |