发明名称 METHOD OF MANUFACTURING NON-VOLATILE MEMORY DEVICE
摘要 A method for manufacturing a non-volatile memory includes depositing a first conductive film and a protective film on a substrate including a logic area and a cell area, patterning the protective film, depositing a hard mask layer on the first conductive film and the patterned protective film to pattern the hard mask layer, using the patterned hard mask layer to form a logic gate on the logic area, exposing a surface of the first conductive film in the cell area and forming a control gate on the cell area.
申请公布号 US2015235868(A1) 申请公布日期 2015.08.20
申请号 US201414523183 申请日期 2014.10.24
申请人 Magnachip Semiconductor, Ltd. 发明人 CHANG Yunseong;KANG Yangbeom
分类号 H01L21/3213;H01L27/115;H01L21/311;H01L21/28;H01L21/02 主分类号 H01L21/3213
代理机构 代理人
主权项 1. A method of manufacturing a non-volatile memory device, comprising: providing a substrate comprising a logic area and a cell area; forming a floating gate on the cell area; depositing a first conductive film and a protective film on the substrate; patterning the protective film; depositing a hard mask layer on the first conductive film and the patterned protective film; patterning the hard mask layer; forming a logic gate on the logic area using the patterned hard mask layer; exposing a surface of the first conductive film in the cell area; and forming a control gate on the cell area.
地址 Cheongju-si KR