发明名称 METHOD OF FORMING SEMICONDUCTOR DEVICE BY USING DOUBLE PATTERNING TECHNOLOGY
摘要 <p>Provided is a method for forming a semiconductor device, comprising the steps of: forming an arrangement of line-type patterns repeatedly disposed by a double patterning technology on a semiconductor substrate; a spacer pattern crossing at least one of the line-type patterns by spacer patterning technology; and selectively removing a line-type pattern portion overlapped with the spacer pattern to separate a pad-type pattern separated from the line-type pattern.</p>
申请公布号 KR20150094073(A) 申请公布日期 2015.08.19
申请号 KR20140014900 申请日期 2014.02.10
申请人 SK HYNIX INC. 发明人 AHN, YEONG BAE;SONG, JOO KYOUNG
分类号 H01L21/027 主分类号 H01L21/027
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