发明名称 |
METHOD OF FORMING SEMICONDUCTOR DEVICE BY USING DOUBLE PATTERNING TECHNOLOGY |
摘要 |
<p>Provided is a method for forming a semiconductor device, comprising the steps of: forming an arrangement of line-type patterns repeatedly disposed by a double patterning technology on a semiconductor substrate; a spacer pattern crossing at least one of the line-type patterns by spacer patterning technology; and selectively removing a line-type pattern portion overlapped with the spacer pattern to separate a pad-type pattern separated from the line-type pattern.</p> |
申请公布号 |
KR20150094073(A) |
申请公布日期 |
2015.08.19 |
申请号 |
KR20140014900 |
申请日期 |
2014.02.10 |
申请人 |
SK HYNIX INC. |
发明人 |
AHN, YEONG BAE;SONG, JOO KYOUNG |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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