发明名称 Reference-based in-band OSNR measurement on polarization-multiplexed signals
摘要 There is provided a method for determining an in-band noise parameter, such as the Optical Signal-to-Noise Ratio (OSNR), on an optical signal-under-test (SUT) propagating along an optical communication link and comprising a data-carrying signal contribution of any arbitrary degree of polarization and a noise contribution. A spectral shape trace of data-carrying signal contribution in the SUT is estimated using a reference optical spectrum trace of a reference signal which comprises a data-carrying signal contribution that is spectrally representative of the data-carrying signal contribution of the SUT and a noise contribution which is at least approximately known. The data-carrying signal contribution is mathematically discriminated from said noise contribution in the SUT using the spectral shape trace and the test optical spectrum trace. The in-band noise parameter is then determined at least from the mathematically discriminated noise contribution.
申请公布号 US9112604(B2) 申请公布日期 2015.08.18
申请号 US201113501708 申请日期 2011.02.14
申请人 EXFO INC. 发明人 Gariepy Daniel;He Gang
分类号 H04B17/00;H04B10/079 主分类号 H04B17/00
代理机构 Norton Rose Fulbright Canada LLP 代理人 Norton Rose Fulbright Canada LLP ;Daoust Alexandre
主权项 1. A method for determining an in-band noise parameter on an optical signal-under-test (SUT) propagating along an optical communication link and comprising a data-carrying signal contribution of any arbitrary degree of polarization and a noise contribution within an optical signal bandwidth, the method comprising: measuring a test optical spectrum trace of said optical signal-under-test at a test point along said optical communication link using an optical spectrum analyzer, said test optical spectrum trace corresponding to a spectral range encompassing at least a portion of said optical signal bandwidth; obtaining a reference optical spectrum trace of a reference signal comprising a data-carrying signal contribution spectrally representative of the data-carrying signal contribution of said signal-under-test, and a noise contribution which is at least approximately known over said optical signal bandwidth; estimating a spectral shape trace of said data-carrying signal contribution in said signal-under-test using said reference optical spectrum trace; using a processing unit, mathematically discriminating said data-carrying signal contribution from said noise contribution in said signal-under-test, within said optical signal bandwidth, using said spectral shape trace and said test optical spectrum trace; and determining said in-band noise parameter on said optical signal-under-test at least from the mathematically discriminated noise contribution.
地址 Quebec CA