发明名称 |
Semiconductor Devices, Methods of Manufacture Thereof, and Methods of Manufacturing Capacitors |
摘要 |
Semiconductor devices, methods of manufacture thereof, and methods of manufacturing capacitors are disclosed. In an embodiment, a method of manufacturing a capacitor includes: etching a trench in a workpiece. The trench may extend into the workpiece from a major surface of the workpiece. The method further includes lining the trench with a bottom electrode material and lining the bottom electrode material in the trench with a dielectric material. The dielectric material may have edges proximate the major surface of the workpiece. The method further includes forming a top electrode material over the dielectric material in the trench, and etching away a portion of the bottom electrode material and a portion of the top electrode material proximate the edges of the dielectric material. |
申请公布号 |
US2015228711(A1) |
申请公布日期 |
2015.08.13 |
申请号 |
US201514695303 |
申请日期 |
2015.04.24 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Tu Kuo-Chi |
分类号 |
H01L49/02;H01L21/3213 |
主分类号 |
H01L49/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing a capacitor, the method comprising:
etching a trench in a workpiece, the trench extending into the workpiece from a major surface of the workpiece; lining the trench with a bottom electrode material; lining the bottom electrode material in the trench with a dielectric material, the dielectric material having edges proximate the major surface of the workpiece; forming a top electrode material over the dielectric material in the trench, the top electrode material filling the trench; and etching away a portion of the bottom electrode material and a portion of the top electrode material proximate the edges of the dielectric material. |
地址 |
Hsin-Chu TW |