发明名称 Semiconductor Devices, Methods of Manufacture Thereof, and Methods of Manufacturing Capacitors
摘要 Semiconductor devices, methods of manufacture thereof, and methods of manufacturing capacitors are disclosed. In an embodiment, a method of manufacturing a capacitor includes: etching a trench in a workpiece. The trench may extend into the workpiece from a major surface of the workpiece. The method further includes lining the trench with a bottom electrode material and lining the bottom electrode material in the trench with a dielectric material. The dielectric material may have edges proximate the major surface of the workpiece. The method further includes forming a top electrode material over the dielectric material in the trench, and etching away a portion of the bottom electrode material and a portion of the top electrode material proximate the edges of the dielectric material.
申请公布号 US2015228711(A1) 申请公布日期 2015.08.13
申请号 US201514695303 申请日期 2015.04.24
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Tu Kuo-Chi
分类号 H01L49/02;H01L21/3213 主分类号 H01L49/02
代理机构 代理人
主权项 1. A method of manufacturing a capacitor, the method comprising: etching a trench in a workpiece, the trench extending into the workpiece from a major surface of the workpiece; lining the trench with a bottom electrode material; lining the bottom electrode material in the trench with a dielectric material, the dielectric material having edges proximate the major surface of the workpiece; forming a top electrode material over the dielectric material in the trench, the top electrode material filling the trench; and etching away a portion of the bottom electrode material and a portion of the top electrode material proximate the edges of the dielectric material.
地址 Hsin-Chu TW