发明名称 ELECTRICAL CONTACT
摘要 <p>The present invention intends to suppress a contact probe from interfering with a guide plate to produce shavings. The present invention has stacked structure that sandwiches an intermediate metallic layer 12 between outer metallic layers 11 and 13, and includes: a contact part 2 that is brought into abutting with a test object; an elastic deformation part 4 that is elastically deformed so as to be curved in a predetermine curve direction N by compression force in the longer direction; and a fore end part 3 that is formed between the contact part 2 and the elastic deformation part 4 and supported by a through-hole 121 of a guide plate 120 so as to make the contact part 2 movable in the longer direction, in which side surfaces of the fore end part 3 formed in the curve direction N and a direction N′opposite to the N of the elastic deformation part 4 are configured to include the three metallic layers 11 to 13, and on the side surfaces, the intermediate metallic layer 12 is configured to protrude relative to the outer metallic layers 11 and 13.</p>
申请公布号 KR20150092094(A) 申请公布日期 2015.08.12
申请号 KR20157011378 申请日期 2013.11.27
申请人 JAPAN ELECTRONICMATERIALS CORP. 发明人 KIMURA TEPPEI;FUKUSHIMA NORIYUKI;URATA ATSUO;ARITA NAOKI;TAKEDA TOMOYUKI
分类号 G01R1/067;G01R1/073 主分类号 G01R1/067
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