发明名称 Method for cleaning skid of surface roughness tester
摘要 A method for cleaning a skid of a surface roughness tester including the skid provided with a skid aperture in a vertical direction, and a stylus disposed in the skid aperture of the skid and capable of moving in the vertical direction, wherein the surface roughness tester measures surface roughness of an object by moving the skid along a surface of the object. The method includes removing a foreign substance existing in a gap between the skid aperture and the stylus after measuring the surface roughness of the object.
申请公布号 US9103656(B2) 申请公布日期 2015.08.11
申请号 US201113178792 申请日期 2011.07.08
申请人 MITUTOYO CORPORATION 发明人 Matsumiya Sadayuki;Hama Nobuyuki
分类号 G01B5/28;B08B1/00;B08B5/04;B08B3/12 主分类号 G01B5/28
代理机构 Rankin, Hill & Clark LLP 代理人 Rankin, Hill & Clark LLP
主权项 1. A method for cleaning a skid of a surface roughness tester including the skid provided with a skid aperture in a vertical direction, and a stylus disposed in the skid aperture of the skid and capable of moving in the vertical direction, wherein the surface roughness tester measures surface roughness of an object by moving the skid along a surface of the object, the method comprising: attaching a suction pad to an under surface of the skid aperture and an end of the stylus; sucking air out of the skid through the skid aperture and the suction pad; and sucking out a solid foreign substance existing in a gap between the skid aperture and the stylus so that the solid foreign substance remains on the suction pad and sucking out a fluid foreign substance existing in the gap through the suction pad, thereby removing the solid and fluid foreign substances existing in the gap after measuring the surface roughness of the object.
地址 Kawasaki-Shi JP