发明名称 Calibration of a time-interleaved analog-to-digital converter
摘要 Examples are provided for a method and apparatus for calibration of an analog-to-digital converter (ADC) including multiple sub-ADCs. The method includes applying a calibration signal to an input node of each sub-ADC. For each sub-ADC, a corresponding error signal is generated based on output signals of the sub-ADC and a reference sub-ADC. Each sub-ADC is calibrated based on the corresponding error signal. The reference sub-ADC is selected by: applying a non-zero input voltage signal to the input node of each sub-ADC, measuring a corresponding output signal of each sub-ADC in response to the non-zero input voltage signal, generating a deviation error based on a subtraction of a stored value from the measured output signal of each sub-ADC, and designating as the reference sub-ADC a sub-ADC from the multiple sub-ADCs based on the deviation error.
申请公布号 US9106249(B1) 申请公布日期 2015.08.11
申请号 US201414477743 申请日期 2014.09.04
申请人 Semtech Corporation 发明人 Dyer Kenneth Colin;Vivrekar Jayant
分类号 H03M1/10;H03M1/12;H03M1/00 主分类号 H03M1/10
代理机构 McDermott Will & Emery LLP 代理人 McDermott Will & Emery LLP
主权项 1. A method for calibration of an analog-to-digital converter (ADC) including a plurality of sub-ADCs, comprising: selecting a reference sub-ADC from the plurality of sub-ADCs based on a non-zero input signal applied to each sub-ADC, a corresponding output signal from each sub-ADC, and a stored value; applying a calibration signal to an input node of each sub-ADC of the plurality of sub-ADCs, other than the reference ADC; for each sub-ADC of the plurality of sub-ADCs, other than the reference ADC, generating a corresponding error signal based on output signals of the sub-ADC and a reference sub-ADC; and calibrating each sub-ADC of the plurality of ADCs, other than the reference ADC, based on the corresponding error signal.
地址 Camarillo CA US