发明名称 |
Calibration of a time-interleaved analog-to-digital converter |
摘要 |
Examples are provided for a method and apparatus for calibration of an analog-to-digital converter (ADC) including multiple sub-ADCs. The method includes applying a calibration signal to an input node of each sub-ADC. For each sub-ADC, a corresponding error signal is generated based on output signals of the sub-ADC and a reference sub-ADC. Each sub-ADC is calibrated based on the corresponding error signal. The reference sub-ADC is selected by: applying a non-zero input voltage signal to the input node of each sub-ADC, measuring a corresponding output signal of each sub-ADC in response to the non-zero input voltage signal, generating a deviation error based on a subtraction of a stored value from the measured output signal of each sub-ADC, and designating as the reference sub-ADC a sub-ADC from the multiple sub-ADCs based on the deviation error. |
申请公布号 |
US9106249(B1) |
申请公布日期 |
2015.08.11 |
申请号 |
US201414477743 |
申请日期 |
2014.09.04 |
申请人 |
Semtech Corporation |
发明人 |
Dyer Kenneth Colin;Vivrekar Jayant |
分类号 |
H03M1/10;H03M1/12;H03M1/00 |
主分类号 |
H03M1/10 |
代理机构 |
McDermott Will & Emery LLP |
代理人 |
McDermott Will & Emery LLP |
主权项 |
1. A method for calibration of an analog-to-digital converter (ADC) including a plurality of sub-ADCs, comprising:
selecting a reference sub-ADC from the plurality of sub-ADCs based on a non-zero input signal applied to each sub-ADC, a corresponding output signal from each sub-ADC, and a stored value; applying a calibration signal to an input node of each sub-ADC of the plurality of sub-ADCs, other than the reference ADC; for each sub-ADC of the plurality of sub-ADCs, other than the reference ADC, generating a corresponding error signal based on output signals of the sub-ADC and a reference sub-ADC; and calibrating each sub-ADC of the plurality of ADCs, other than the reference ADC, based on the corresponding error signal. |
地址 |
Camarillo CA US |