| 摘要 |
<p>For the purpose of accurately detecting a short circuit of a semiconductor element, a delay circuit is connected to an output stage of a comparison circuit that compares a gate voltage and a reference value with each other. Specifically, this semiconductor element protection circuit is characterized in being provided with: a comparison circuit (1), which detects a voltage between a gate terminal and a source terminal of a semiconductor element having the drain terminal, the source terminal, and a gate terminal, and which compares the voltage with a first threshold value; a comparison circuit (2), which detects a voltage between the drain terminal and the source terminal of the semiconductor element, and which compares the voltage with a second threshold value; a delay circuit (1), which delays output signals of the comparison circuit (1); and a short circuit determining circuit, which determines a short circuit of the semiconductor element on the basis of outputs from the delay circuit (1) and the comparison circuit (2).</p> |
