发明名称 PROBER
摘要 PROBLEM TO BE SOLVED: To provide a prober which supplies air having high cleanliness and a low dew point into a chamber.SOLUTION: A prober 1 includes: a chamber 2 which stores a wafer chuck 21 and a probe card 22; a circulation duct 3 which is connected with the chamber 2 through an intake port 2a and an exhaust port 2b and forms an air circulation passage; and a fan filter unit 42 and an exhaust fan 43 which circulate the air in the circulation passage. The prober 1 further includes dry air supply means 5 which supplies dry air for lowering a dew point of the air to the interior of the circulation duct 3.
申请公布号 JP2015144155(A) 申请公布日期 2015.08.06
申请号 JP20140016286 申请日期 2014.01.31
申请人 TOKYO SEIMITSU CO LTD 发明人 MORIYAMA SATORU
分类号 H01L21/66 主分类号 H01L21/66
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