发明名称 INSPECTION APPARATUS AND INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To accurately detect a defect on a printed board. ! SOLUTION: An inspection apparatus includes a color image pickup part for acquiring a color pickup image and a black-and-white image pickup part for acquiring a black-and-white pickup image. In a plating part 92 on a printed board, a value of a pixel in the black-and-white pickup image becomes a maximum pixel value and a value of a pixel in the color pickup image is lower than the maximum pixel value. In a solder resist part 91, contrast in the black-and-white pickup image is higher than contrast in the color pickup image. A defect detection part detects defects in the plating part 92 and a silk part 93 on the printed board by using the color pickup image and detects a defect in the solder resist part 91 on the printed board by using the black-and-white pickup image. Consequently, defects can be accurately detected in each of the solder resist part 91, the plating part 92 and the silk part 93. ! COPYRIGHT: (C)2015,JPO&INPIT
申请公布号 JP2015143656(A) 申请公布日期 2015.08.06
申请号 JP20140017108 申请日期 2014.01.31
申请人 SCREEN HOLDINGS CO LTD 发明人 SHIOMI JUNICHI
分类号 G01N21/956 主分类号 G01N21/956
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