发明名称 OPTICAL CHARACTERISTICS MEASURING METHOD AND OPTICAL CHARACTERISTICS MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To solve a problem in which, when optical characteristics of a measuring object in a cell are measured, a photoelastic effect of an entrance window and an emission window as optical windows of the cell reduces accuracy in measuring original optical characteristics of the measuring object. ! SOLUTION: An optical characteristics measuring method includes the steps of: arranging a measuring object in a cell; measuring a Mueller matrix of a system including a window from deflected incident light and emission light obtained through an emission window by radiating the incident light to the measuring object through an entrance window of the cell; acquiring a birefringence phase difference and a main axis azimuth of the entrance window and the emission window from the measured Mueller matrix of the system including the window; acquiring Mueller matrices of the entrance window and the emission window; acquiring a Mueller matrix of the measuring object; and acquiring Ψ indicating an amplitude
申请公布号 JP2015143618(A) 申请公布日期 2015.08.06
申请号 JP20140016281 申请日期 2014.01.31
申请人 UNIV OF YAMANASHI 发明人 JIN LIANHUA ; KONDO HIDEKAZU
分类号 G01N21/21;G01N21/23 主分类号 G01N21/21
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