A METHOD TO EVALUATE THE PRESENCE OF A SOURCE OF X RAY BEAM INHOMOGENEITY DURING X RAY EXPOSURE

摘要

A statistical analysis is performed on pixel values of at least one region of interest in an image obtained by substantially uniform irradiation of an x- ray detector and deciding upon the presence of source of x -ray beam in homogeneity by comparing the results of the statistical analysis with at least one predetermined acceptance criterion.