发明名称 System And Method For Non-Contact Assessment of Changes In Critical Material Properties
摘要 A material signature detector that provides for the assessment of changes in critical material properties of materials such as pharmaceuticals and solutions is disclosed. The material signature detector is non-contact and non-invasive and provides the ability to detect unintended changes in the contents of a vial or other container during the fill-finish process, transport, compounding, or storage. The material signature detector uses a novel resonant electrical impulse spectroscopy circuit that employs quadrature demodulation at lower frequencies to detect changes in the capacitance and conductance (resistance) of the sample under test. A series of digital signatures are created at different frequencies to provide an overall assessment of changes in the properties of the material under test. These digital signatures may in turn be stored in an electronic library for subsequent analytics.
申请公布号 US2015212027(A1) 申请公布日期 2015.07.30
申请号 US201414165502 申请日期 2014.01.27
申请人 Dhurjaty Sreeram 发明人 Dhurjaty Sreeram
分类号 G01N27/02 主分类号 G01N27/02
代理机构 代理人
主权项 1. A material signature detector for non-contact assessment of changes in critical material properties comprising: an electrical circuit comprising a sense resistor in series with both an element and a sample under test; a frequency source electrically coupled between the sense resistor and a ground return; a quadrature demodulator electrically coupled to the sense resistor; and an analog to digital converter to create digital signatures from analog signals received from the quadrature demodulator.
地址 Rochester NY US