发明名称 |
CIRCUIT SUBSTRATE, MANUFACTURING METHOD THEREOF AND DISPLAY DEVICE |
摘要 |
The present invention provides a circuit substrate that can reduce Cgd capacitance, sufficiently prevent the influence of Cgd capacitance on applied voltage, together with sufficiently make the reliability of the circuit substrate favorable, to provide a method of manufacturing thereof, and a display device. The circuit substrate of the present invention is a circuit substrate with a semiconductor element arranged on a transparent substrate, in which the semiconductor element is provided with an oxide semiconductor layer; the circuit substrate is provided with an etch-stop layer and a conductive layer, having a region overlapping with neither the etch-stop layer nor the conductive layer, and with at least one portion of the region overlapping with a cutout portion of the oxide semiconductor layer, when the main surface of the circuit substrate is planarly viewed; and a portion of an edge of a cutout portion of the oxide semiconductor layer is located on a side of the etch-stop layer beyond an edge of the etch-stop layer, when the main surface of the circuit substrate is planarly viewed. |
申请公布号 |
US2015214375(A1) |
申请公布日期 |
2015.07.30 |
申请号 |
US201314426234 |
申请日期 |
2013.09.05 |
申请人 |
Sharp Kabushiki Kaisha |
发明人 |
Hara Yoshihito;Nakata Yukinobu |
分类号 |
H01L29/786;H01L29/45;H01L29/66;H01L27/12;H01L21/441;H01L21/465;H01L21/4757;H01L29/24;H01L21/02 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
1. A circuit substrate comprising:
a transparent substrate; a semiconductor element disposed on the transparent substrate, said semiconductor element including a patterned oxide semiconductor layer; an etch-stop layer covering at least a center portion of the oxide semiconductor layer, the etch-stop layer being made of an insulating material and having an opening therein; and a patterned conductive layer covering at least a portion of the etch-stop layer, the patterned conductive layer including a source electrode, a source wiring line, and a drain electrode, wherein a part of an edge of the oxide semiconductor layer is defined by an edge of the opening in the etch-stop layer and is tucked under said edge of the etch-stop layer. |
地址 |
Osaka JP |