发明名称 PON SYSTEM, OLT, ONU, AND CONDUCTION CHARACTERISTIC DETERIORATION DETECTION METHOD
摘要 <p>PROBLEM TO BE SOLVED: To detect conduction characteristic deterioration.SOLUTION: An OLT 1 comprises: a test frame transmission unit 15 which generates test frames 102 having the designated number 1015 of transmission frames and transmits the test frames to an ONU 4; and a test frame reception unit 16 which receives test frames 103 from the ONU 4 and detects conduction characteristic deterioration from the number of the received test frames and the number 1015 of transmission frames. The ONU 4 comprises: a test frame reception unit 43 which receives test frames 102 from the OLT1 and detects conduction characteristic deterioration from the number of the received test frames 102 and the number 1015 of transmission frames; and a test frame transmission unit 44 which generates test frames 103 having the number 1015 of transmission frames and transmits the test frames 103 to the OLT 1.</p>
申请公布号 JP2015139184(A) 申请公布日期 2015.07.30
申请号 JP20140011133 申请日期 2014.01.24
申请人 MITSUBISHI ELECTRIC CORP 发明人 MURAKAMI KEN;SAITO KEN
分类号 H04L12/44 主分类号 H04L12/44
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