发明名称 |
Forming high aspect ratio isolation structures |
摘要 |
An isolation structure, such as a trench isolation structure, may be formed by forming an aperture in a semiconductor substrate and then filling the aperture with boron. In some embodiments, the aperture filling may use atomic layer deposition. In some cases, the boron may be amorphous boron. The aperture may be a high aspect ratio aperture, such as a trench, in some embodiments. |
申请公布号 |
US9093266(B2) |
申请公布日期 |
2015.07.28 |
申请号 |
US201113083836 |
申请日期 |
2011.04.11 |
申请人 |
Micron Technology, Inc. |
发明人 |
Borsari Silvia;Lazzari Carla Maria |
分类号 |
H01L21/70;H01L21/76;H01L21/02;H01L29/06;H01L21/762 |
主分类号 |
H01L21/70 |
代理机构 |
Dorsey & Whitney LLP |
代理人 |
Dorsey & Whitney LLP |
主权项 |
1. A method comprising:
forming an electrically isolating aperture in a semiconductor substrate; and filling the aperture with a material consisting essentially of amorphous boron. |
地址 |
Boise ID US |