发明名称 |
PHOTORESIST OVERCOAT COMPOSITIONS |
摘要 |
PROBLEM TO BE SOLVED: To provide overcoat compositions which allow formation of fine patterns using a negative tone development process.SOLUTION: Photoresist overcoat compositions comprise: a quenching polymer which comprises a first unit having a basic moiety and a second unit formed from a specific monomer; and an organic solvent. The quenching polymer is present in the composition in an amount of 80 to 100 wt.% based on total solids of the overcoat composition. |
申请公布号 |
JP2015135492(A) |
申请公布日期 |
2015.07.27 |
申请号 |
JP20150000587 |
申请日期 |
2015.01.05 |
申请人 |
ROHM & HAAS ELECTRONIC MATERIALS LLC |
发明人 |
PARK JONG KEUN;CHRISTOPHER NAM LEE;CECILY ANDES;LEE CHOONG-BONG |
分类号 |
G03F7/11;C08F220/10;C08F220/34;C08F220/60;H01L21/027 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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