发明名称 PHOTORESIST OVERCOAT COMPOSITIONS
摘要 PROBLEM TO BE SOLVED: To provide overcoat compositions which allow formation of fine patterns using a negative tone development process.SOLUTION: Photoresist overcoat compositions comprise: a quenching polymer which comprises a first unit having a basic moiety and a second unit formed from a specific monomer; and an organic solvent. The quenching polymer is present in the composition in an amount of 80 to 100 wt.% based on total solids of the overcoat composition.
申请公布号 JP2015135492(A) 申请公布日期 2015.07.27
申请号 JP20150000587 申请日期 2015.01.05
申请人 ROHM & HAAS ELECTRONIC MATERIALS LLC 发明人 PARK JONG KEUN;CHRISTOPHER NAM LEE;CECILY ANDES;LEE CHOONG-BONG
分类号 G03F7/11;C08F220/10;C08F220/34;C08F220/60;H01L21/027 主分类号 G03F7/11
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