发明名称 LOW RESISTIVITY OHMIC CONTACT
摘要 <p>Embodiments of a low resistivity ohmic contact are disclosed. In some embodiments, a method of fabricating a low resistivity ohmic contact includes providing a semiconductor material layer and intentionally roughening the semiconductor material layer to create a characteristic surface roughness. The method also includes providing an ohmic contact metal layer on a surface of the semiconductor material layer and providing a diffusion barrier metal layer on a surface of the ohmic contact metal layer opposite the semiconductor material layer. In this way, the adhesive force between the semiconductor material layer and the ohmic contact metal layer may be increased.</p>
申请公布号 WO2015109227(A1) 申请公布日期 2015.07.23
申请号 WO2015US11816 申请日期 2015.01.16
申请人 PHONONIC DEVICES, INC. 发明人 REED, JASON D.;RUMSEY, JAIME A.;HESS, RONALD R.;PREJS, ARTHUR;WELLENIUS, IAN PATRICK;GRAY, ALLEN L.
分类号 C23C28/02;H01L35/16;H01L35/34 主分类号 C23C28/02
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