APPARATUS FOR PERFORMING A POWER LOSS TEST FOR A NON-VOLATILE MEMORY DEVICE AND METHOD OF PERFORMING A POWER LOSS TEST FOR A NON-VOLATILE MEMORY DEVICE

摘要

The present invention relates to an apparatus for testing power loss of a non-volatile memory device including: a test board unit that includes a socket in which a non-volatile memory device to be tested is inserted in order to perform a power loss test on the non-volatile memory device having at least one pin displaying an operation state of internal NAND flash memories; a micro-controller unit that detects the operation state of the internal NAND flash memories from the pin and determines supply and cutting of power needed for operation of the non-volatile memory device based on the operation state of the internal NAND flash memories; and a tester unit that provides predetermined writing commands to the non-volatile memory device and, at the same time, performs the power loss test on the non-volatile memory device based on the supply and the cutting of power.