发明名称 気相成長方法及び気相成長装置
摘要 <p>A vapor growth method includes: loading a wafer into a reaction chamber and placing the wafer on a support unit; heating the wafer with a heater provided below the support unit and controlling an output of the heater so that the wafer reaches a predetermined temperature; rotating the wafer and supplying process gas onto the wafer, thereby forming a film on the wafer; unloading the wafer from the reaction chamber; supplying etching gas into the reaction chamber and removing a reaction product deposited inside the reaction chamber by etching; and detecting an etching end point based on variation in a first temperature, which is a temperature on the support unit when the output of the heater is controlled to have a predetermined amount, or variation in the output of the heater, which is controlled so that the first temperature reaches a predetermined temperature.</p>
申请公布号 JP5750339(B2) 申请公布日期 2015.07.22
申请号 JP20110189353 申请日期 2011.08.31
申请人 发明人
分类号 H01L21/205;C23C16/44;H01L21/31 主分类号 H01L21/205
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