| 摘要 |
Disclosed is a sampling system and method for reflection spectrum measurement for testing gemstones, including: a first light source (1), a second light source (2), a filter element, an integrating sphere (S), an optical fiber (9), a spectral detection module (10), an analog-to-digital conversion module (11) and a data processing terminal (12). The integrating sphere (S) has an incidence hole, a sampling port (6) and an exit port for reflected light (7). The sampling system and method can collect real-time spectrum of reflected light from gemstones, and effectively acquire "all-optical" information within the user-selected wavelength range, which resolves the uncertainty in measuring sample of various shapes, omits the monochrome scanning, mechanical light splitting and other complicated steps, and greatly improves the efficiency of gemstones testing. It can be widely used in the jewelry identifying industry as a sampling system and method of reflection spectrum measurement for testing gemstones with excellent performance. |
