发明名称 半導体装置およびその作製方法
摘要 <p>An object is to provide a thin film transistor including an oxide semiconductor layer, in which a material used for the oxide semiconductor layer and a material used for source and drain electrode layers are prevented from reacting with each other. The source and drain electrode layers provided over a substrate having an insulating surface have a stacked structure of two or more layers. In the stack of layers, a layer which is in contact with an oxide semiconductor layer is a metal layer including a metal element other than a metal element included in the oxide semiconductor layer. An element selected from Sn, Sb, Se, Te, Pd, Ag, Ni, and Cu; an alloy containing any of these elements as a component; an alloy containing any of these elements in combination; or the like is used for a material of the metal layer used.</p>
申请公布号 JP5751792(B2) 申请公布日期 2015.07.22
申请号 JP20100226200 申请日期 2010.10.06
申请人 发明人
分类号 H01L29/786 主分类号 H01L29/786
代理机构 代理人
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